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1 Ergebnisse
1
A Comparison Among DPI Immunities of Multi-Stage CSVCOs and..:
, In:
2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)
,
Khan, Qazi Mashaal
;
Ramezani, Akram
;
Koohestani, Mohsen
.. - p. 123-127 , 2022
Link:
https://doi.org/10.1109/EMCCompo52133.2022.9758599
RT T1 <cTitle>2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)</cTitle>: T1 <Title>A Comparison Among DPI Immunities of Multi-Stage CSVCOs and Ring Oscillators</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9758599&Exemplar=1&LAN=DE A1 Khan, Qazi Mashaal A1 Ramezani, Akram A1 Koohestani, Mohsen A1 Ramdani, Mohamed A1 Perdriau, Richard YR 2022 SN 2575-6893 K1 Ring oscillators K1 Radio frequency K1 Semiconductor device measurement K1 Voltage-controlled oscillators K1 Current measurement K1 Immunity testing K1 Inverters K1 Integrated Circuits K1 EMC K1 DPI K1 Susceptibility K1 VCO SP 123 OP 127 LK http://dx.doi.org/https://doi.org/10.1109/EMCCompo52133.2022.9758599 DO https://doi.org/10.1109/EMCCompo52133.2022.9758599 SF ELIB - SuUB Bremen
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