I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Analysis of Deep Depletion Effect in SOI LDMOS Substrate wi..:
, In:
2022 4th Asia Energy and Electrical Engineering Symposium (AEEES)
,
Wu, Jian
;
Yang, Xiaoming
;
Li, Tianqian
.. - p. 605-608 , 2022
Link:
https://doi.org/10.1109/AEEES54426.2022.9759725
RT T1 <cTitle>2022 4th Asia Energy and Electrical Engineering Symposium (AEEES)</cTitle>: T1 <Title>Analysis of Deep Depletion Effect in SOI LDMOS Substrate with Numerical Simulation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9759725&Exemplar=1&LAN=DE A1 Wu, Jian A1 Yang, Xiaoming A1 Li, Tianqian A1 Li, Baiqiang A1 Yang, Zhiguo YR 2022 K1 Analytical models K1 Power demand K1 Silicon-on-insulator K1 Reliability engineering K1 Software K1 Silicon K1 Semiconductor process modeling K1 silicon on insulator K1 laterally-diffused metal-oxide semiconductor K1 dynamic breakdown voltage K1 deep depletion effect SP 605 OP 608 LK http://dx.doi.org/https://doi.org/10.1109/AEEES54426.2022.9759725 DO https://doi.org/10.1109/AEEES54426.2022.9759725 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
