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1 Ergebnisse
1
Physical Adversarial Attacks in Simulated Environments:
, In:
2021 IEEE Applied Imagery Pattern Recognition Workshop (AIPR)
,
Threet, Michael
;
Busho, Colin
;
Harguess, Josh
... - p. 1-5 , 2021
Link:
https://doi.org/10.1109/AIPR52630.2021.9762099
RT T1 <cTitle>2021 IEEE Applied Imagery Pattern Recognition Workshop (AIPR)</cTitle>: T1 <Title>Physical Adversarial Attacks in Simulated Environments</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9762099&Exemplar=1&LAN=DE A1 Threet, Michael A1 Busho, Colin A1 Harguess, Josh A1 Jutras, Melanie A1 Lape, Nicole A1 Leary, Sara A1 Manville, Keith A1 Tan, Mike A1 Ward, Chris YR 2021 SN 2332-5615 K1 Training K1 Measurement K1 Image quality K1 Machine learning algorithms K1 Image color analysis K1 Pipelines K1 Lighting K1 machine learning K1 object detection K1 adversarial patch K1 simulation SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/AIPR52630.2021.9762099 DO https://doi.org/10.1109/AIPR52630.2021.9762099 SF ELIB - SuUB Bremen
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