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Single-Event Latchup Vulnerability at the 7-nm FinFET Node:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Pieper, N. J. ; Xiong, Y. ; Feeley, A... - p. 5C.2-1-5C.2-6 , 2022
Link: https://doi.org/10.1109/IRPS48227.2022.9764419