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The Field-dependence Endurance Model and Its Mutual Effect ..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Chang, Y. K. ; Liao, P. J. ; Yeong, S. H.... - p. 3A.1-1-3A.1-5 , 2022
Link: https://doi.org/10.1109/IRPS48227.2022.9764420