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1 Ergebnisse
1
Failure analysis addressing method of optically undetected ..:
, In:
2022 IEEE International Reliability Physics Symposium (IRPS)
,
Alessandrino, S.
;
Carbone, B.
;
Cordiano, F.
... - p. P61-1-P61-4 , 2022
Link:
https://doi.org/10.1109/IRPS48227.2022.9764423
RT T1 <cTitle>2022 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9764423&Exemplar=1&LAN=DE A1 Alessandrino, S. A1 Carbone, B. A1 Cordiano, F. A1 Mazza, B. A1 Russo, A. A1 Coco, W. A1 Boscaglia, M. A1 Salvo, A. Di A1 Lombardo, A. A1 Scarcella, D. A1 Vitanza, E. A1 Fiorenza, P. YR 2022 SN 1938-1891 K1 Parametric study K1 Failure analysis K1 Logic gates K1 Reliability K1 Leakage currents K1 Nonlinear optics K1 Optical devices K1 4H-SiC MOSFET K1 defectivity recognition K1 failure analysis K1 Current separation SP P61 OP 1-P61-4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48227.2022.9764423 DO https://doi.org/10.1109/IRPS48227.2022.9764423 SF ELIB - SuUB Bremen
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