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1 Ergebnisse
1
Reliability of Non-Volatile Memory Devices for Neuromorphic..:
, In:
2022 IEEE International Reliability Physics Symposium (IRPS)
,
Padovani, Andrea
;
Pesic, Milan
;
Nardi, Federico
... - p. 1-10 , 2022
Link:
https://doi.org/10.1109/IRPS48227.2022.9764451
RT T1 <cTitle>2022 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Reliability of Non-Volatile Memory Devices for Neuromorphic Applications: A Modeling Perspective (Invited)</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9764451&Exemplar=1&LAN=DE A1 Padovani, Andrea A1 Pesic, Milan A1 Nardi, Federico A1 Milo, Valerio A1 Larcher, Luca A1 Kumar, Mondol Anik A1 Baten, Md Zunaid YR 2022 SN 1938-1891 K1 Neuromorphics K1 Nonvolatile memory K1 Computational modeling K1 Linearity K1 Computer architecture K1 Artificial neural networks K1 Reliability K1 Neuromorphic computing K1 electronic synapse K1 device simulations K1 3D-NAND K1 RRAM K1 Ferroelectric K1 Ginestra® SP 1 OP 10 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48227.2022.9764451 DO https://doi.org/10.1109/IRPS48227.2022.9764451 SF ELIB - SuUB Bremen
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