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Electron-assisted switching in FeFETs: Memory window dynami..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Pesic, Milan ; Beltrando, Bastien ; Padovani, Andrea... - p. 4A.1-1-4A.1-8 , 2022
Link: https://doi.org/10.1109/IRPS48227.2022.9764520