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1 Ergebnisse
1
Electron-assisted switching in FeFETs: Memory window dynami..:
, In:
2022 IEEE International Reliability Physics Symposium (IRPS)
,
Pesic, Milan
;
Beltrando, Bastien
;
Padovani, Andrea
... - p. 4A.1-1-4A.1-8 , 2022
Link:
https://doi.org/10.1109/IRPS48227.2022.9764520
RT T1
2022 IEEE International Reliability Physics Symposium (IRPS)
: T1
Electron-assisted switching in FeFETs: Memory window dynamics – retention – trapping mechanisms and correlation
UL https://suche.suub.uni-bremen.de/peid=ieee-9764520&Exemplar=1&LAN=DE A1 Pesic, Milan A1 Beltrando, Bastien A1 Padovani, Andrea A1 Miyashita, Toshihiko A1 Kim, Nam-Sung A1 Larcher, Luca YR 2022 SN 1938-1891 K1 Degradation K1 Electron traps K1 Switches K1 Logic gates K1 FinFETs K1 Iron K1 Hafnium compounds K1 FeFET K1 HZO K1 Charge – trapping K1 retention K1 MW K1 degradation K1 ferroelectric HfOx SP 4A.1 OP 1-4A.1-8 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48227.2022.9764520 DO https://doi.org/10.1109/IRPS48227.2022.9764520 SF ELIB - SuUB Bremen
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