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Soft Error Characterization of D-FFs at the 5-nm Bulk FinFE..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Xiong, Y. ; Feeley, A. ; Pieper, N. J.... - p. 7C.3-1-7C.3-7 , 2022
Link: https://doi.org/10.1109/IRPS48227.2022.9764523