I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Incorporation of a Simple ESD Circuit in a 650V E-Mode GaN ..:
, In:
2022 IEEE International Reliability Physics Symposium (IRPS)
,
Lee, Jian-Hsing
;
Huang, Yeh-Jen
;
Hong, Li-Yang
... - p. 2B.3-1-2B.3-6 , 2022
Link:
https://doi.org/10.1109/IRPS48227.2022.9764596
RT T1 <cTitle>2022 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Incorporation of a Simple ESD Circuit in a 650V E-Mode GaN HEMT for All-Terminal ESD Protection</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9764596&Exemplar=1&LAN=DE A1 Lee, Jian-Hsing A1 Huang, Yeh-Jen A1 Hong, Li-Yang A1 Chen, Li-Fan A1 Jou, Yeh-Ning A1 Lin, Shin-Cheng A1 Wohlmuth, Walter A1 Liao, Chih-Cherng A1 Li, Ching-Ho A1 Huang, Shoa-Chang A1 Chen, Ke-Horng YR 2022 SN 1938-1891 K1 Resistors K1 HEMTs K1 Logic gates K1 Electrostatic discharges K1 Transistors K1 MODFETs K1 Integrated circuit reliability K1 Electrostatic-Discharge (ESD) K1 High Electron Mobility Transistor (HEMT) K1 Human body Model (HBM) K1 Two-Dimensional Electron Gas (2D-EG) K1 Transmission-Line Pulse (TLP) SP 2B.3 OP 1-2B.3-6 LK http://dx.doi.org/https://doi.org/10.1109/IRPS48227.2022.9764596 DO https://doi.org/10.1109/IRPS48227.2022.9764596 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
