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Improving IJTAG Test Efficiency and Security:

, In: 2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT),
Wang, Sying-Jyan ; Shih, Yen-Chang ; Li, Katherine Shu-Min.. - p. 1-4 , 2022
Link: https://doi.org/10.1109/VLSI-DAT54769.2022.9768048