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1 Ergebnisse
1
A Thermal Quorum Sensing Scheme for Enhancement of Integrat..:
, In:
2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
,
Wang, Hong-Hao
;
Chuang, Po-Yao
;
Wu, Cheng-Wen
- p. 1-4 , 2022
Link:
https://doi.org/10.1109/VLSI-DAT54769.2022.9768056
RT T1
2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
: T1
A Thermal Quorum Sensing Scheme for Enhancement of Integrated-Circuit Reliability and Lifetime
UL https://suche.suub.uni-bremen.de/peid=ieee-9768056&Exemplar=1&LAN=DE A1 Wang, Hong-Hao A1 Chuang, Po-Yao A1 Wu, Cheng-Wen YR 2022 SN 2472-9124 K1 Temperature sensors K1 Symbiosis K1 Correlation K1 Voltage K1 Hardware K1 Semiconductor process modeling K1 Reliability K1 dynamic voltage and frequency scaling (DVFS) K1 embedded thermal sensor K1 fault tolerance K1 online repair K1 quorum sensing K1 reliability K1 symbiotic system SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/VLSI-DAT54769.2022.9768056 DO https://doi.org/10.1109/VLSI-DAT54769.2022.9768056 SF ELIB - SuUB Bremen
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