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1 Ergebnisse
1
ML-based Fast On-Chip Transient Thermal Simulation for Hete..:
, In:
2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
,
Kumar, Akhilesh
;
Chang, Norman
;
Geb, David
... - p. 1-8 , 2022
Link:
https://doi.org/10.1109/VLSI-DAT54769.2022.9768082
RT T1
2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
: T1
ML-based Fast On-Chip Transient Thermal Simulation for Heterogeneous 2.5D/3D IC Designs
UL https://suche.suub.uni-bremen.de/peid=ieee-9768082&Exemplar=1&LAN=DE A1 Kumar, Akhilesh A1 Chang, Norman A1 Geb, David A1 He, Haiyang A1 Pan, Stephen A1 Wen, Jimin A1 Asgari, Saeed A1 Abarham, Mehdi A1 Ortiz, Chris YR 2022 SN 2472-9124 K1 Transient response K1 Runtime K1 Design automation K1 Computational modeling K1 Very large scale integration K1 Thermal management K1 Thermal analysis K1 Thermal K1 VLSI K1 2.5D/3D-IC K1 Machine Learning K1 Reliability K1 FEA K1 CFD SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/VLSI-DAT54769.2022.9768082 DO https://doi.org/10.1109/VLSI-DAT54769.2022.9768082 SF ELIB - SuUB Bremen
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