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1 Ergebnisse
1
Single Chip of Electrostatic Discharge Detector for IC Manu..:
, In:
2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
,
Wu, I-Hsuan
;
Ker, Ming-Dou
- p. 1-4 , 2022
Link:
https://doi.org/10.1109/VLSI-DAT54769.2022.9768083
RT T1
2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
: T1
Single Chip of Electrostatic Discharge Detector for IC Manufacturing Field Control
UL https://suche.suub.uni-bremen.de/peid=ieee-9768083&Exemplar=1&LAN=DE A1 Wu, I-Hsuan A1 Ker, Ming-Dou YR 2022 SN 2472-9124 K1 Voltage measurement K1 Power supplies K1 Detectors K1 Very large scale integration K1 Electrostatic discharges K1 Silicon K1 Production facilities K1 ESD K1 ESD detector K1 logarithmic amplifier SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/VLSI-DAT54769.2022.9768083 DO https://doi.org/10.1109/VLSI-DAT54769.2022.9768083 SF ELIB - SuUB Bremen
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