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1 Ergebnisse
1
Dynamic Characteristics of Normally-OFF Silicon Carbide JFE:
, In:
2021 IEEE 2nd International Conference on Signal, Control and Communication (SCC)
,
Shili, K.
;
Gharbi, R.
;
Karoui, M. Ben
- p. 101-106 , 2021
Link:
https://doi.org/10.1109/SCC53769.2021.9768362
RT T1 <cTitle>2021 IEEE 2nd International Conference on Signal, Control and Communication (SCC)</cTitle>: T1 <Title>Dynamic Characteristics of Normally-OFF Silicon Carbide JFET</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9768362&Exemplar=1&LAN=DE A1 Shili, K. A1 Gharbi, R. A1 Karoui, M. Ben YR 2021 K1 Silicon carbide K1 Switches K1 Capacitance K1 SPICE K1 JFETs K1 Transistors K1 High frequency K1 SiC K1 JFET- Normally-off K1 Dynamic Characteristics K1 device simulation SP 101 OP 106 LK http://dx.doi.org/https://doi.org/10.1109/SCC53769.2021.9768362 DO https://doi.org/10.1109/SCC53769.2021.9768362 SF ELIB - SuUB Bremen
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