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1
Fault Recognition and Isolation Approach in Direct Current ..:
, In:
2022 First International Conference on Electrical, Electronics, Information and Communication Technologies (ICEEICT)
,
Reddy, N. Nageswara
;
Velpula, Rajesh
;
Raja, P.
. - p. 1-5 , 2022
Link:
https://doi.org/10.1109/ICEEICT53079.2022.9768543
RT T1
2022 First International Conference on Electrical, Electronics, Information and Communication Technologies (ICEEICT)
: T1
Fault Recognition and Isolation Approach in Direct Current Microgrids
UL https://suche.suub.uni-bremen.de/peid=ieee-9768543&Exemplar=1&LAN=DE A1 Reddy, N. Nageswara A1 Velpula, Rajesh A1 Raja, P. A1 Moorthi, S. YR 2022 K1 Resistance K1 Fault diagnosis K1 Philosophical considerations K1 Handheld computers K1 Microgrids K1 Voltage K1 Power electronics K1 Fault recognition K1 faulty line isolation K1 computed resistance K1 least square method and DC microgrid protection SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ICEEICT53079.2022.9768543 DO https://doi.org/10.1109/ICEEICT53079.2022.9768543 SF ELIB - SuUB Bremen
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