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Novel Bit-by-bit Repair to Demonstrate STT-MRAM as NV-RAM:

, In: 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Liu, Cheng-Jye ; Lin, Chin-Hsi ; Chen, Kuan-Yu. - p. 1-2 , 2022
Link: https://doi.org/10.1109/VLSI-TSA54299.2022.9770971