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1 Ergebnisse
1
Novel Method for Accelerated Thermal Cycling of Gallium Nit..:
, In:
2022 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Kulothungan, Gnana S.
;
Sayed, Hussain
;
Krishnamoorthy, Harish S.
- p. 909-914 , 2022
Link:
https://doi.org/10.1109/APEC43599.2022.9773414
RT T1
2022 IEEE Applied Power Electronics Conference and Exposition (APEC)
: T1
Novel Method for Accelerated Thermal Cycling of Gallium Nitride Power Devices to Perform Reliability Assessment
UL https://suche.suub.uni-bremen.de/peid=ieee-9773414&Exemplar=1&LAN=DE A1 Kulothungan, Gnana S. A1 Sayed, Hussain A1 Krishnamoorthy, Harish S. YR 2022 SN 2470-6647 K1 Degradation K1 Temperature K1 Field effect transistors K1 Estimation K1 Reliability K1 Object recognition K1 Gallium nitride K1 semiconductor device reliability K1 thermal cycling K1 junction temperature estimation SP 909 OP 914 LK http://dx.doi.org/https://doi.org/10.1109/APEC43599.2022.9773414 DO https://doi.org/10.1109/APEC43599.2022.9773414 SF ELIB - SuUB Bremen
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