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1 Ergebnisse
1
Gate Drive Circuit with In situ Condition Monitoring System..:
, In:
2022 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Hayashi, Shin-Ichiro
;
Wada, Keiji
- p. 1838-1845 , 2022
Link:
https://doi.org/10.1109/APEC43599.2022.9773501
RT T1
2022 IEEE Applied Power Electronics Conference and Exposition (APEC)
: T1
Gate Drive Circuit with In situ Condition Monitoring System for Detecting Gate Oxide Degradation of SiC MOSFETs
UL https://suche.suub.uni-bremen.de/peid=ieee-9773501&Exemplar=1&LAN=DE A1 Hayashi, Shin-Ichiro A1 Wada, Keiji YR 2022 SN 2470-6647 K1 Condition monitoring K1 Temperature measurement K1 Degradation K1 MOSFET K1 Voltage measurement K1 Silicon carbide K1 Logic gates K1 condition monitoring K1 gate drive circuit K1 gate oxide K1 long-term reliability K1 SiC MOSFET SP 1838 OP 1845 LK http://dx.doi.org/https://doi.org/10.1109/APEC43599.2022.9773501 DO https://doi.org/10.1109/APEC43599.2022.9773501 SF ELIB - SuUB Bremen
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