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1 Ergebnisse
1
Measurement of Metallurgical p-n Junction Temperature by Dy..:
, In:
2022 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM)
,
Varlamov, D. O.
;
Manyakhin, F. I.
;
Shishkov, A. N.
. - p. 948-952 , 2022
Link:
https://doi.org/10.1109/ICIEAM54945.2022.9787250
RT T1 <cTitle>2022 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM)</cTitle>: T1 <Title>Measurement of Metallurgical p-n Junction Temperature by Dynamics of Current-Induced Heating and Cooling</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9787250&Exemplar=1&LAN=DE A1 Varlamov, D. O. A1 Manyakhin, F. I. A1 Shishkov, A. N. A1 Skvortsov, A. A. YR 2022 K1 Temperature measurement K1 Temperature sensors K1 Heating systems K1 Semiconductor device measurement K1 Temperature distribution K1 Voltage measurement K1 Sensitivity K1 temperature change K1 p-n junction K1 LED K1 laser diode SP 948 OP 952 LK http://dx.doi.org/https://doi.org/10.1109/ICIEAM54945.2022.9787250 DO https://doi.org/10.1109/ICIEAM54945.2022.9787250 SF ELIB - SuUB Bremen
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