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Evaluating Features for Machine Learning Detection of Order..:

, In: 2022 IEEE Conference on Software Testing, Verification and Validation (ICST),
Parry, Owain ; Kapfhammer, Gregory M. ; Hilton, Michael. - p. 93-104 , 2022
Link: https://doi.org/10.1109/ICST53961.2022.00021