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1 Ergebnisse
1
Yield Improvement Methodology with addressing Design System..:
, In:
2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
,
Yin, Jianhua
;
Chen, Ian
;
Chokanathan, Rakesh
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/ASMC54647.2022.9792517
RT T1 <cTitle>2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)</cTitle>: T1 <Title>Yield Improvement Methodology with addressing Design Systematics during Production Ramp-up</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9792517&Exemplar=1&LAN=DE A1 Yin, Jianhua A1 Chen, Ian A1 Chokanathan, Rakesh A1 Gyawali, Suraj A1 Du, Yuchen A1 Wang, Yuansong A1 Liu, Xue Mei A1 Lim, CT A1 Gao, Wen Zhi YR 2022 SN 2376-6697 K1 Integrated circuits K1 Systematics K1 Design methodology K1 Production K1 Semiconductor device manufacture K1 Manufacturing K1 Pattern matching K1 Yield Improvement Methodology K1 Design Systematics K1 Production Ramp-up K1 Design Analysis K1 IC manufacturing K1 Pattern Matching SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ASMC54647.2022.9792517 DO https://doi.org/10.1109/ASMC54647.2022.9792517 SF ELIB - SuUB Bremen
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