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Detection of Pathological Artifacts Caused by COVID-19 Usin..:

, In: 2022 IEEE International Conference on Distributed Computing and Electrical Circuits and Electronics (ICDCECE),
Aravind, Duduka ; Nagajyothi, D. ; Jabeen, Neha. - p. 1-5 , 2022
Link: https://doi.org/10.1109/ICDCECE53908.2022.9793174