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1 Ergebnisse
1
Automatically Identifying Shared Root Causes of Test Breaka..:
, In:
2022 IEEE/ACM 44th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP)
,
An, Gabin
;
Yoon, Juyeon
;
Sohn, Jeongju
... - p. 65-74 , 2022
Link:
https://doi.org/10.1145/3510457.3513051
RT T1
2022 IEEE/ACM 44th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP)
: T1
Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA
UL https://suche.suub.uni-bremen.de/peid=ieee-9793878&Exemplar=1&LAN=DE A1 An, Gabin A1 Yoon, Juyeon A1 Sohn, Jeongju A1 Hong, Jingun A1 Hwang, Dongwon A1 Yoo, Shin YR 2022 K1 Root cause analysis K1 Pipelines K1 Computer bugs K1 Debugging K1 Manuals K1 Predictive models K1 Feature extraction K1 Continuous Integration K1 Test Similarity K1 Root Cause Analysis SP 65 OP 74 LK http://dx.doi.org/https://doi.org/10.1145/3510457.3513051 DO https://doi.org/10.1145/3510457.3513051 SF ELIB - SuUB Bremen
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