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1 Ergebnisse
1
Surveying the Developer Experience of Flaky Tests:
, In:
2022 IEEE/ACM 44th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP)
,
Parry, Owain
;
Kapfhammer, Gregory M.
;
Hilton, Michael
. - p. 253-262 , 2022
Link:
https://doi.org/10.1145/3510457.3513037
RT T1
2022 IEEE/ACM 44th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP)
: T1
Surveying the Developer Experience of Flaky Tests
UL https://suche.suub.uni-bremen.de/peid=ieee-9793965&Exemplar=1&LAN=DE A1 Parry, Owain A1 Kapfhammer, Gregory M. A1 Hilton, Michael A1 McMinn, Phil YR 2022 K1 Codes K1 Social networking (online) K1 Software K1 Software engineering K1 Software Testing K1 Flaky Tests K1 Qualitative Research SP 253 OP 262 LK http://dx.doi.org/https://doi.org/10.1145/3510457.3513037 DO https://doi.org/10.1145/3510457.3513037 SF ELIB - SuUB Bremen
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