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1 Ergebnisse
1
Innovative Practices Track: Innovative Analog Circuit Testi..:
, In:
2022 IEEE 40th VLSI Test Symposium (VTS)
,
Mangelsdorf, Chris
;
Madhvaraj, Manasa
;
Mir, Salvador
... - p. 1-1 , 2022
Link:
https://doi.org/10.1109/VTS52500.2021.9794191
RT T1
2022 IEEE 40th VLSI Test Symposium (VTS)
: T1
Innovative Practices Track: Innovative Analog Circuit Testing Technologies
UL https://suche.suub.uni-bremen.de/peid=ieee-9794191&Exemplar=1&LAN=DE A1 Mangelsdorf, Chris A1 Madhvaraj, Manasa A1 Mir, Salvador A1 Barragan, Manuel A1 Iimori, Daisuke A1 Nakatani, Takayuki A1 Katayama, Shogo A1 Ogihara, Gaku A1 Zhao, Yujie A1 Wei, Jianglin A1 Kuwana, Anna A1 Katoh, Kentaroh A1 Hatayama, Kazumi A1 Kobayashi, Haruo A1 Sato, Keno A1 Ishida, Takashi A1 Okamoto, Toshiyuki A1 Ichikawa, Tamotsu YR 2022 SN 2375-1053 K1 Force measurement K1 Electric variables measurement K1 Signal processing algorithms K1 Analog circuits K1 Very large scale integration K1 Thermal force K1 Thermal analysis K1 ADC Testing K1 Jitter K1 On-chip Measurement K1 Self-Referenced Measurement K1 FD-SOI Technology K1 Electric Motive Force K1 Thermal Effects K1 DC-AC Conversion K1 High Precision Measurement SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/VTS52500.2021.9794191 DO https://doi.org/10.1109/VTS52500.2021.9794191 SF ELIB - SuUB Bremen
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