I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Effect of Gate Pad Layout on Thermal Impedance of SiC-MOSFE:
, In:
2022 International Conference on Electronics Packaging (ICEP)
,
Kato, F.
;
Sato, S.
;
Hozoji, H.
... - p. 149-150 , 2022
Link:
https://doi.org/10.23919/ICEP55381.2022.9795453
RT T1 <cTitle>2022 International Conference on Electronics Packaging (ICEP)</cTitle>: T1 <Title>Effect of Gate Pad Layout on Thermal Impedance of SiC-MOSFET</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9795453&Exemplar=1&LAN=DE A1 Kato, F. A1 Sato, S. A1 Hozoji, H. A1 Ikegawa, M. A1 Sakai, A. A1 Watanabe, K. A1 Harada, S. A1 Sato, H. YR 2022 K1 Semiconductor device measurement K1 Power measurement K1 Silicon carbide K1 Thermal resistance K1 Multichip modules K1 Logic gates K1 Predictive models K1 SiC-MOSFET K1 SWITCH-MOS K1 thermal impedance K1 transient thermal analysis SP 149 OP 150 LK http://dx.doi.org/https://doi.org/10.23919/ICEP55381.2022.9795453 DO https://doi.org/10.23919/ICEP55381.2022.9795453 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
