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What Do Developer-Repaired Flaky Tests Tell Us About the Ef..:

, In: 2022 IEEE/ACM International Conference on Automation of Software Test (AST),
Parry, Owain ; Hilton, Michael ; Kapfhammer, Gregory M.. - p. 160-164 , 2022
Link: https://doi.org/10.1145/3524481.3527227