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1 Ergebnisse
1
Reliability and Prospects of Logic-in-Memory Circuits:
, In:
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Zanotti, Tommaso
- p. 369-371 , 2022
Link:
https://doi.org/10.1109/EDTM53872.2022.9798047
RT T1 <cTitle>2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Reliability and Prospects of Logic-in-Memory Circuits</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9798047&Exemplar=1&LAN=DE A1 Zanotti, Tommaso YR 2022 K1 Computational modeling K1 Computer architecture K1 Reliability engineering K1 Manufacturing K1 Energy efficient computing K1 Integrated circuit reliability K1 Integrated circuit modeling K1 Reliability K1 LiM K1 and RRAM SP 369 OP 371 LK http://dx.doi.org/https://doi.org/10.1109/EDTM53872.2022.9798047 DO https://doi.org/10.1109/EDTM53872.2022.9798047 SF ELIB - SuUB Bremen
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