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Design Space Exploration for Scaled FeFET Nonvolatile Memor..:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Liu, You-Sheng ; Huang, Yuan-Yu ; Su, Pin - p. 70-72 , 2022
Link: https://doi.org/10.1109/EDTM53872.2022.9798076