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1 Ergebnisse
1
STT-MRAM Product Reliability and Cross-Talk:
, In:
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Naik, V. B.
;
Yamane, K.
;
Kwon, J.
... - p. 366-368 , 2022
Link:
https://doi.org/10.1109/EDTM53872.2022.9798086
RT T1 <cTitle>2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>STT-MRAM Product Reliability and Cross-Talk</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9798086&Exemplar=1&LAN=DE A1 Naik, V. B. A1 Yamane, K. A1 Kwon, J. A1 Lim, J.H. A1 Balasankaran, N. A1 Chung, N.L. A1 Hau, L.Y. A1 Chao, R. A1 Chiang, C. A1 Huang, Y. A1 Pu, L. A1 Ma, L. A1 Meng, C. A1 Otani, Y. A1 Zhang, L. A1 Jang, S.H. A1 Ling, T. A1 Ting, J.W. A1 Yoon, H. A1 Mueller, J. A1 Pfefferling, B. A1 Kallensee, O. A1 Merbeth, T. A1 Seet, C.S. A1 Wong, J. A1 You, Y.S. A1 Soss, S. A1 Chan, T.H. A1 Siah, S.Y. YR 2022 K1 Radio frequency K1 Resistance K1 Temperature distribution K1 Nonvolatile memory K1 Random access memory K1 Immunity testing K1 Magnetic fields K1 STT-MRAM K1 Reliability K1 Immunity SP 366 OP 368 LK http://dx.doi.org/https://doi.org/10.1109/EDTM53872.2022.9798086 DO https://doi.org/10.1109/EDTM53872.2022.9798086 SF ELIB - SuUB Bremen
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