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1 Ergebnisse
1
Area-efficient Power-rail ESD Clamp Circuit with False-trig..:
, In:
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Shen, Zilong
;
Wang, Yize
;
Zhang, Xing
. - p. 271-273 , 2022
Link:
https://doi.org/10.1109/EDTM53872.2022.9798142
RT T1
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
: T1
Area-efficient Power-rail ESD Clamp Circuit with False-trigger Immunity in 28nm CMOS Process
UL https://suche.suub.uni-bremen.de/peid=ieee-9798142&Exemplar=1&LAN=DE A1 Shen, Zilong A1 Wang, Yize A1 Zhang, Xing A1 Wang, Yuan YR 2022 K1 Transient response K1 Semiconductor device measurement K1 Electrostatic discharges K1 CMOS process K1 Time measurement K1 Silicon K1 Clamps K1 electrostatic discharge (ESD) K1 power-rail clamp circuit and area-efficient SP 271 OP 273 LK http://dx.doi.org/https://doi.org/10.1109/EDTM53872.2022.9798142 DO https://doi.org/10.1109/EDTM53872.2022.9798142 SF ELIB - SuUB Bremen
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