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1 Ergebnisse
1
Realization of NOR logic using Cu/ZnO/Pt CBRAM:
, In:
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Liu, Chunyang
;
Guo, Lei
;
Qiao, Zheng
... - p. 132-134 , 2022
Link:
https://doi.org/10.1109/EDTM53872.2022.9798160
RT T1 <cTitle>2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Realization of NOR logic using Cu/ZnO/Pt CBRAM</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9798160&Exemplar=1&LAN=DE A1 Liu, Chunyang A1 Guo, Lei A1 Qiao, Zheng A1 Li, Jie A1 Ren, Pengpeng A1 Ye, Sheng A1 Zhou, Bo A1 Zhang, Jianfu A1 Ji, Zhigang A1 Wang, Runsheng A1 Huang, Ru YR 2022 K1 Resistance K1 Fabrication K1 Voltage measurement K1 Three-dimensional displays K1 Switches K1 Logic gates K1 Zinc oxide K1 in-memory computing K1 RRAM K1 NOR logic SP 132 OP 134 LK http://dx.doi.org/https://doi.org/10.1109/EDTM53872.2022.9798160 DO https://doi.org/10.1109/EDTM53872.2022.9798160 SF ELIB - SuUB Bremen
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