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1 Ergebnisse
1
Heteroscedastic Gaussian Process Regression for ReRAM Devic..:
, In:
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Hossen, Imtiaz
;
Zang, Yi
;
Anders, Mark A.
.. - p. 360-362 , 2022
Link:
https://doi.org/10.1109/EDTM53872.2022.9798256
RT T1 <cTitle>2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Heteroscedastic Gaussian Process Regression for ReRAM Device Modeling</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9798256&Exemplar=1&LAN=DE A1 Hossen, Imtiaz A1 Zang, Yi A1 Anders, Mark A. A1 Wang, Lin A1 Adam, Gina C. YR 2022 K1 Neural networks K1 Gaussian processes K1 Machine learning K1 Market research K1 Data models K1 Manufacturing K1 Standards K1 ReRAM K1 Device modeling K1 Jump table SP 360 OP 362 LK http://dx.doi.org/https://doi.org/10.1109/EDTM53872.2022.9798256 DO https://doi.org/10.1109/EDTM53872.2022.9798256 SF ELIB - SuUB Bremen
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