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AIMD calculation on electron ionization induced fragmentati..:

, In: 22nd International Symposium on High Voltage Engineering (ISH 2021),

Xiong, J. ; Zhang, B. ; Hao, M... - p. None , 2021

Link: https://doi.org/10.1049/icp.2022.0135

RT 
T1 <cTitle>22nd International Symposium on High Voltage Engineering (ISH 2021)</cTitle>: T1 <Title>AIMD calculation on electron ionization induced fragmentations of C5F10O and its discharge decomposition products</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-9800279&Exemplar=1&LAN=DE
				
A1 Xiong, J.
A1 Zhang, B.
A1 Hao, M.
A1 Yang, T.
A1 Li, X.
YR 2021
K1 ab initio calculations
K1 chromatography
K1 electron impact dissociation
K1 electron impact ionisation
K1 mass spectroscopic chemical analysis
K1 mass spectroscopy
K1 molecular dynamics method
K1 molecule-electron collisions
K1 organic compounds
K1 reaction kinetics theory
K1 fragmentations
K1 discharge decomposition products
K1 global warming potential
K1 gas-insulated switchgears
K1 gas chromatography-mass spectrometry
K1 GC-MS
K1 gas phase fragmentation pathways
K1 ab initio molecular dynamics simulations
K1 electron ionization mass spectrometry
K1 electron-impact ionization
K1 electron ionization
K1 EI-MS
K1 ionization threshold
K1 quantum chemistry calculation
K1 perfluoroketone
SP None
LK http://dx.doi.org/https://doi.org/10.1049/icp.2022.0135
DO https://doi.org/10.1049/icp.2022.0135
SF ELIB - SuUB Bremen

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