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1 Ergebnisse
1
Influence of X-ray Source Spectrum on TID Degradation of CM..:
, In:
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)
,
Teplyakova, A. O.
;
Egorov, A. Yu.
;
Kalashnikov, V. D.
... - p. 1-3 , 2022
Link:
https://doi.org/10.1109/MWENT55238.2022.9802295
RT T1 <cTitle>2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)</cTitle>: T1 <Title>Influence of X-ray Source Spectrum on TID Degradation of CMOS Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9802295&Exemplar=1&LAN=DE A1 Teplyakova, A. O. A1 Egorov, A. Yu. A1 Kalashnikov, V. D. A1 Ulanova, A. V. A1 Marfin, V. A. A1 Rogovaia, M. A. YR 2022 K1 Degradation K1 Integrated circuits K1 Radiation effects K1 Ionizing radiation K1 Conferences K1 Aluminum K1 CMOS technology K1 X-ray source K1 X-ray spectrum K1 CMOS VLSI K1 parameter degradation K1 absorbed dose effect SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/MWENT55238.2022.9802295 DO https://doi.org/10.1109/MWENT55238.2022.9802295 SF ELIB - SuUB Bremen
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