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1 Ergebnisse
1
Programmable set to monitor charge state change of MIS devi..:
, In:
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)
,
Andreev, Dmitrii V.
;
Bondarenko, Gennady G.
;
Andreev, Vladimir V.
. - p. 1-3 , 2022
Link:
https://doi.org/10.1109/MWENT55238.2022.9802396
RT T1
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)
: T1
Programmable set to monitor charge state change of MIS devices under high-fields
UL https://suche.suub.uni-bremen.de/peid=ieee-9802396&Exemplar=1&LAN=DE A1 Andreev, Dmitrii V. A1 Bondarenko, Gennady G. A1 Andreev, Vladimir V. A1 Loskutov, Sergey A. YR 2022 K1 Integrated circuits K1 Semiconductor device measurement K1 Voltage measurement K1 Current measurement K1 Capacitance-voltage characteristics K1 Semiconductor device manufacture K1 Time measurement K1 MIS structures K1 charge state K1 dielectric K1 programmable set K1 high fields SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/MWENT55238.2022.9802396 DO https://doi.org/10.1109/MWENT55238.2022.9802396 SF ELIB - SuUB Bremen
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