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1 Ergebnisse
1
Layout-Dependent Noise Performance of Single-Photon Avalanc..:
, In:
2022 45th Jubilee International Convention on Information, Communication and Electronic Technology (MIPRO)
,
Pozar, B.
;
Berdalovic, I.
;
Bogdanovic, F.
.. - p. 133-138 , 2022
Link:
https://doi.org/10.23919/MIPRO55190.2022.9803649
RT T1 <cTitle>2022 45th Jubilee International Convention on Information, Communication and Electronic Technology (MIPRO)</cTitle>: T1 <Title>Layout-Dependent Noise Performance of Single-Photon Avalanche Diodes in 180 nm High-Voltage CMOS Technology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9803649&Exemplar=1&LAN=DE A1 Pozar, B. A1 Berdalovic, I. A1 Bogdanovic, F. A1 Markovic, L. A1 Suligoj, T. YR 2022 SN 2623-8764 K1 Performance evaluation K1 Voltage measurement K1 Current measurement K1 Layout K1 Printed circuits K1 CMOS technology K1 System-on-chip K1 single photon avalanche diodes (SPADs) K1 dark count rate (DCR) K1 afterpulsing K1 photodetectors K1 CMOS image sensors K1 photon counting K1 TCAD simulations K1 layout SP 133 OP 138 LK http://dx.doi.org/https://doi.org/10.23919/MIPRO55190.2022.9803649 DO https://doi.org/10.23919/MIPRO55190.2022.9803649 SF ELIB - SuUB Bremen
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