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Analysis of the Security Vulnerabilities of 2.5-D and 3-D I..:

, In: 2022 23rd International Symposium on Quality Electronic Design (ISQED),
Rao, Vaibhav Venugopal ; Sasan, Avesta ; Savidis, Ioannis - p. 1-7 , 2022
Link: https://doi.org/10.1109/ISQED54688.2022.9806155