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Layout-based Vulnerability Analysis of LEON3 Processor to S..:
, In:
2022 23rd International Symposium on Quality Electronic Design (ISQED)
,
Nethula, Sowmith
;
Bansal, Vivek
;
Hamad, Ghaith Bany
. - p. 1-6 , 2022
Link:
https://doi.org/10.1109/ISQED54688.2022.9806199
RT T1
2022 23rd International Symposium on Quality Electronic Design (ISQED)
: T1
Layout-based Vulnerability Analysis of LEON3 Processor to Single Event Multiple Transients using Satisfiability Modulo Theories
UL https://suche.suub.uni-bremen.de/peid=ieee-9806199&Exemplar=1&LAN=DE A1 Nethula, Sowmith A1 Bansal, Vivek A1 Hamad, Ghaith Bany A1 Ait Mohamed, Otmane YR 2022 SN 1948-3295 K1 Layout K1 Reliability theory K1 Central Processing Unit K1 Circuit faults K1 Transistors K1 Servers K1 Transient analysis K1 Radiation effects K1 Formal verification K1 Reliability K1 Satisfiability Modulo Theories (SMT) K1 Single Event Multiple Transients (SEMTs) SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ISQED54688.2022.9806199 DO https://doi.org/10.1109/ISQED54688.2022.9806199 SF ELIB - SuUB Bremen
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