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Low-IR-Drop Test Pattern Regeneration Using A Fast Predicto:

, In: 2022 23rd International Symposium on Quality Electronic Design (ISQED),
Liu, Shi-Tang ; Chen, Jia-Xian ; Wu, Yu-Tsung... - p. 27-32 , 2022
Link: https://doi.org/10.1109/ISQED54688.2022.9806245