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1 Ergebnisse
1
Model Auto Extraction for Gate-All-Around Silicon Nanowire ..:
, In:
2022 23rd International Symposium on Quality Electronic Design (ISQED)
,
Yang, Ya-Shu
;
Li, Yiming
- p. 1-6 , 2022
Link:
https://doi.org/10.1109/ISQED54688.2022.9806274
RT T1
2022 23rd International Symposium on Quality Electronic Design (ISQED)
: T1
Model Auto Extraction for Gate-All-Around Silicon Nanowire MOSFETs Using A Decomposition-Based Many-Objective Evolutionary Algorithm
UL https://suche.suub.uni-bremen.de/peid=ieee-9806274&Exemplar=1&LAN=DE A1 Yang, Ya-Shu A1 Li, Yiming YR 2022 SN 1948-3295 K1 Semiconductor device modeling K1 Fabrication K1 MOSFET K1 Gallium arsenide K1 Evolutionary computation K1 Logic gates K1 Silicon K1 Model auto extraction K1 compact model parameter extraction K1 conventional planar devices K1 nanowire K1 nanosheet K1 MOSFETs K1 evolutionary algorithm K1 MaOEA/D-2ADV SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ISQED54688.2022.9806274 DO https://doi.org/10.1109/ISQED54688.2022.9806274 SF ELIB - SuUB Bremen
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