I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Metrological validation of a photogrammetry-based technique:
, In:
2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
,
Sebar, Leila Es
;
Lombardo, Luca
;
Parvis, Marco
... - p. 1-6 , 2022
Link:
https://doi.org/10.1109/I2MTC48687.2022.9806510
RT T1 <cTitle>2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)</cTitle>: T1 <Title>Metrological validation of a photogrammetry-based technique</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9806510&Exemplar=1&LAN=DE A1 Sebar, Leila Es A1 Lombardo, Luca A1 Parvis, Marco A1 Angelini, Emma A1 Re, Alessandro A1 Grassini, Sabrina A1 Bovero, Alessandro A1 Giudice, Alessandro Lo YR 2022 SN 2642-2077 K1 Solid modeling K1 Three-dimensional displays K1 Coordinate measuring machines K1 Measurement uncertainty K1 Imaging K1 Documentation K1 Length measurement K1 photogrammetry K1 multispectral imaging K1 reference object K1 metrology K1 cultural heritage K1 Coordinate Measuring Machine K1 CMM SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/I2MTC48687.2022.9806510 DO https://doi.org/10.1109/I2MTC48687.2022.9806510 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
