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1 Ergebnisse
1
Parasitic Effects from Cooling of GaN Power Transistors - I..:
, In:
2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia)
,
Weiler, Pelle
;
Bokmans, Bart
;
Lemmen, Erik
.. - p. 485-491 , 2022
Link:
https://doi.org/10.23919/IPEC-Himeji2022-ECCE53331.202..
RT T1 <cTitle>2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia)</cTitle>: T1 <Title>Parasitic Effects from Cooling of GaN Power Transistors - Impact on Switching Losses and Common-Mode Currents</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9806879&Exemplar=1&LAN=DE A1 Weiler, Pelle A1 Bokmans, Bart A1 Lemmen, Erik A1 Vermulst, Bas A1 Wijnands, Korneel YR 2022 K1 Heating systems K1 Insulation K1 Cooling K1 Thermal resistance K1 Current measurement K1 Electromagnetic interference K1 Switching loss K1 Gallium-nitride K1 Parasitic capacitance K1 Switching losses SP 485 OP 491 LK http://dx.doi.org/https://doi.org/10.23919/IPEC-Himeji2022-ECCE53331.2022.9806879 DO https://doi.org/10.23919/IPEC-Himeji2022-ECCE53331.2022.9806879 SF ELIB - SuUB Bremen
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