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1 Ergebnisse
1
AMSER-FF: Area-Minimized Soft-Error-Recoverable Flip-Flop f..:
, In:
2021 IEEE International Test Conference in Asia (ITC-Asia)
,
Tang, John Z.-L
;
Lin, Dave Y.-W.
;
Yee, Ralf E.-H.
. - p. 1-6 , 2021
Link:
https://doi.org/10.1109/ITC-Asia53059.2021.9808678
RT T1
2021 IEEE International Test Conference in Asia (ITC-Asia)
: T1
AMSER-FF: Area-Minimized Soft-Error-Recoverable Flip-Flop for Radiation Hardening
UL https://suche.suub.uni-bremen.de/peid=ieee-9808678&Exemplar=1&LAN=DE A1 Tang, John Z.-L A1 Lin, Dave Y.-W. A1 Yee, Ralf E.-H. A1 Wen, Charles H.-P. YR 2021 SN 2768-069X K1 Degradation K1 Radiation hardening (electronics) K1 Conferences K1 Redundancy K1 Buildings K1 Voltage K1 Generators K1 radiation hardening K1 soft error K1 single-event transient K1 single-event upset K1 radiation hardening by design K1 delayed latching K1 flip-flop SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ITC-Asia53059.2021.9808678 DO https://doi.org/10.1109/ITC-Asia53059.2021.9808678 SF ELIB - SuUB Bremen
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