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1 Ergebnisse
1
PVT Analysis for RRAM and STT-MRAM-based Logic Computation-..:
, In:
2022 IEEE European Test Symposium (ETS)
,
Fieback, Moritz
;
Munch, Christopher
;
Gebregiorgis, Anteneh
... - p. 1-6 , 2022
Link:
https://doi.org/10.1109/ETS54262.2022.9810436
RT T1
2022 IEEE European Test Symposium (ETS)
: T1
PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory
UL https://suche.suub.uni-bremen.de/peid=ieee-9810436&Exemplar=1&LAN=DE A1 Fieback, Moritz A1 Munch, Christopher A1 Gebregiorgis, Anteneh A1 Medeiros, Guilherme Cardoso A1 Taouil, Mottaqiallah A1 Hamdioui, Said A1 Tahoori, Mehdi YR 2022 SN 1558-1780 K1 Temperature sensors K1 Performance evaluation K1 Torque K1 Sensitivity analysis K1 Nonvolatile memory K1 Resistive RAM K1 Europe K1 Computation-in-Memory (CiM) K1 PVT K1 emerging memories K1 STT-MRAM K1 RRAM K1 reliability SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ETS54262.2022.9810436 DO https://doi.org/10.1109/ETS54262.2022.9810436 SF ELIB - SuUB Bremen
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