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Verifying the Wakefield Induced by an Ultra-High-Power Micr..:

, In: 2022 IEEE International Conference on Plasma Science (ICOPS),
Cao, Y. ; Bliokh, Y. P. ; Leopold, J. G... - p. 1-1 , 2022
Link: https://doi.org/10.1109/ICOPS45751.2022.9813120