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1 Ergebnisse
1
Charge Balance and UIS Robustness of Trench Field Plate Pow..:
, In:
2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
,
Saxena, Tanuj
;
Torrent, Christian
;
Khemka, Vishnu
.. - p. 9-12 , 2022
Link:
https://doi.org/10.1109/ISPSD49238.2022.9813612
RT T1
2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
: T1
Charge Balance and UIS Robustness of Trench Field Plate Power MOSFETs
UL https://suche.suub.uni-bremen.de/peid=ieee-9813612&Exemplar=1&LAN=DE A1 Saxena, Tanuj A1 Torrent, Christian A1 Khemka, Vishnu A1 Qin, Ganming A1 Gibson, Mark YR 2022 SN 1946-0201 K1 Location awareness K1 Integrated circuits K1 MOSFET K1 Switches K1 Logic gates K1 Robustness K1 Power semiconductor devices K1 field plate MOSFET K1 trench MOSFET K1 shielded gate K1 UIS K1 avalanche K1 charge balance SP 9 OP 12 LK http://dx.doi.org/https://doi.org/10.1109/ISPSD49238.2022.9813612 DO https://doi.org/10.1109/ISPSD49238.2022.9813612 SF ELIB - SuUB Bremen
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