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Charge Balance and UIS Robustness of Trench Field Plate Pow..:

, In: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Saxena, Tanuj ; Torrent, Christian ; Khemka, Vishnu.. - p. 9-12 , 2022
Link: https://doi.org/10.1109/ISPSD49238.2022.9813612