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1 Ergebnisse
1
Demonstration of the Surge Current Capability of Embedded S..:
, In:
2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
,
Kitamura, Yudai
;
Yano, Hiroshi
;
Iwamuro, Noriyuki
... - p. 109-112 , 2022
Link:
https://doi.org/10.1109/ISPSD49238.2022.9813646
RT T1 <cTitle>2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD)</cTitle>: T1 <Title>Demonstration of the Surge Current Capability of Embedded SBDs in SiC SBD-Integrated Trench MOSFETs with a Thick Cu Block</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9813646&Exemplar=1&LAN=DE A1 Kitamura, Yudai A1 Yano, Hiroshi A1 Iwamuro, Noriyuki A1 Kato, Fumiki A1 Tanaka, So A1 Tawara, Takeshi A1 Harada, Shinsuke A1 Sato, Hiroshi YR 2022 SN 1946-0201 K1 Electrodes K1 MOSFET K1 Semiconductor device measurement K1 Temperature K1 Silicon carbide K1 Switches K1 Logic gates K1 SiC MOSFETs K1 SWITCH-MOS K1 Internal diodes K1 Surge current capability K1 Heat capacitance block K1 TCAD simulation SP 109 OP 112 LK http://dx.doi.org/https://doi.org/10.1109/ISPSD49238.2022.9813646 DO https://doi.org/10.1109/ISPSD49238.2022.9813646 SF ELIB - SuUB Bremen
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