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300 mA/mm Drain Current Density P-Type Enhancement-Mode Oxi..:

, In: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Fu, Yu ; Chang, Yuhao ; Zhu, Xiaohua... - p. 121-124 , 2022
Link: https://doi.org/10.1109/ISPSD49238.2022.9813655